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Advanced Trace Analysis

	Advanced Trace Analysis by Susanta Lahiri
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	Advanced Trace Analysis in six chapters, by eminent scientists, discusses statistical approaches to verify trace element analysis data, trace analysis techniques like ICPMS and XRF, ion beam analysis techniques, speciation analysis of uranium relevant to waste disposal and management along with the use of greener techniques for trace elemental speciation analysis. ISBN - 9788184870299
	Pages : 188

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